Determination of Structure Factors by the Pendellosung Effect for Imperfect Crystals

Abstract

An investigation of thickness dependence of the X-ray integrated intensity of monochromatic linearly polarised X-ray radiation in a symmetrical Laue-case diffraction reveals that the method of determination of structure factors f from thickness oscillations can be extended to real crystals with a static distribution of Coulomb-type defects or dislocations. The f E value (where E is the static Debye-Waller factor) is determined from the oscillation period, while E is determined from the tilt-angle tangent of the oscillation axis of the reduced integrated intensity.