
TY  - JOUR
A1  - Hirsch, PB 
T1  - The Role of Electron Microscopy in Materials Science
JF  - Australian Journal of Physics
JO  - Aust. J.  Phys.
Y1  - 1982
VL  - 35
IS  - 6
SP  - 727
EP  - 736
KW  - 
UR  - https://doi.org/10.1071/PH820727 
N2  - The properties of the materials in a component or a device depend on structure and composition often on a scale of 10-10 to 10-6 m. Electron microscopy and microanalytical techniques provide a powerful means for determining the structure and composition on the appropriate scale, lead to an understanding of basic mechanisms, and by correlation or in situ experiments to explanations of bulk properties. Examples are given of the application of a variety of powerful electron optical techniques to a number of materials problems. 
ER  -

