
%0 Journal Article
%A James, Michael 
%T <emph type="2">Current Chemistry</emph>: Characterization of Thin-Film Surfaces and Interfaces Using Neutron Reflectometry
%J Australian Journal of Chemistry
%D 2002/02/04
%V 54
%N 8
%P 487-491
%K 
%R https://doi.org/10.1071/CH01132
%U https://www.publish.csiro.au/paper/CH01132 
%X Neutron reflectometry has become an increasingly important technique in the characterization of thin-film surfaces and interfaces. Recent advances in instrumentation, experimental design, sample environments and methods of data analysis now make it possible to obtain an angstrom-precision depth profile of the film composition. Neutrons are non-destructive and highly penetrating which makes them ideal probes for the study of buried interfaces as well as surfaces under a wide range of extreme environments. Isotopic H/D substitution (particularly in colloidal, polymeric or biological systems) provides a unique tool for selectively labelling different components of complex planar architectures. The fundamental aspects of neutron reflectometry are discussed, and the utility of this technique is illustrated by a review of several recent studies. 
