
TY  - JOUR
A1  - James, Michael 
T1  - <emph type="2">Current Chemistry</emph>: Characterization of Thin-Film Surfaces and Interfaces Using Neutron Reflectometry
JF  - Australian Journal of Chemistry
JO  - Aust. J. Chem.
Y1  - 2002
VL  - 54
IS  - 8
SP  - 487
EP  - 491
KW  - 
UR  - https://doi.org/10.1071/CH01132 
N2  - Neutron reflectometry has become an increasingly important technique in the characterization of thin-film surfaces and interfaces. Recent advances in instrumentation, experimental design, sample environments and methods of data analysis now make it possible to obtain an angstrom-precision depth profile of the film composition. Neutrons are non-destructive and highly penetrating which makes them ideal probes for the study of buried interfaces as well as surfaces under a wide range of extreme environments. Isotopic H/D substitution (particularly in colloidal, polymeric or biological systems) provides a unique tool for selectively labelling different components of complex planar architectures. The fundamental aspects of neutron reflectometry are discussed, and the utility of this technique is illustrated by a review of several recent studies. 
ER  -

