
TY  - JOUR
A1  - Prevatt, Jeff 
A1  - Denton, M. Bonner 
T1  - Advances in the Application of Array Detectors for Improved Chemical Analysis, Part II. Rapid Trace Metal Analysis of High Solids Wastewater and Sludge Using a Direct Current Plasma Source Equipped with an Echelle Spectrometer and a Charge-Injection Device Detector
JF  - Australian Journal of Chemistry
JO  - Aust. J. Chem.
Y1  - 2003
VL  - 56
IS  - 3
SP  - 133
EP  - 140
KW  - 
UR  - https://doi.org/10.1071/CH02201 
N2  - A direct current plasma (DCP) source, equipped with an echelle spectrometer and charge-injection device (CID) detector, was employed for the analysis of trace metals in municipal sludge and wastewater containing high solids. The use of DCP as a plasma source has largely vanished in the past decade due to the popularity of inductively coupled plasma. Resurrecting this robust plasma source and coupling it to a state-of-the-art echelle spectrometer provides for an extremely forgiving analytical technique capable of analysing trace metals rapidly, even in complex high-solid matrices. Instrument performance is further enhanced as the echelle/CID spectrometer provides a simultaneous multi-element fingerprint of contaminants in the waste. The improved design offers increased sensitivity in the far ultraviolet, with overall wavelength coverage from 175 to 800 nm. Furthermore, multi-element analysis is obtained quickly with minimal or no sample preparation, making this the fastest screening technique available. 
ER  -

