
%0 Journal Article
%A White, John W. 
%A Brown, Anthony S. 
%A Holt, Stephen A. 
%A Saville, Paul M. 
%T Neutron and X-ray Reflectometry: Solid Multilayers and Crumpling Films
%J Australian Journal of Physics
%D 1997/03/21
%V 50
%N 2
%P 391-405
%K 
%R https://doi.org/10.1071/P96021
%U https://www.publish.csiro.au/paper/P96021 
%X The structures of films and interfaces at the molecular level can be determined from specular reflectivity measurements using neutrons and X-rays. A general introduction to the principles of neutron and X-ray reflectometry is given. Illustrative examples of the application of neutron and X-ray reflectometry to problems of chemical and physical interest are presented. 
