
%0 Journal Article
%A Garrod, RI 
%A Brett, JF 
%A MacDonald, JA 
%T X-Ray Line Broadening and Pure Diffraction Contours
%J Australian Journal of Physics
%D 1954/03/01
%V 7
%N 1
%P 77-95
%K 
%R https://doi.org/10.1071/PH540077
%U https://www.publish.csiro.au/paper/PH540077 
%X In analysing the data from experiments designed to distinguish between particle size and distortion broadening from polycrystalline materials, it is customary either to employ correction formulae to obtain the true broadening ß, or to derive the pure diffraction contour in terms of a Fourier series whose coefficients may be evaluated from the experimental line profiles. 
