
%0 Journal Article
%A Head, AK 
%T The Reconstruction of Displacement Fields of Defects in Crystals from Electron Micrographs
%J Australian Journal of Physics
%D 1969/06/01
%V 22
%N 3
%P 345-350
%K 
%R https://doi.org/10.1071/PH690345
%U https://www.publish.csiro.au/paper/PH690345 
%X It is shown that the theorem of Part I, namely, that there is a unique reversible connection between displacement fields and electron micrographs for the case of two-beam diffraction and analytic displacement fields, can be extended to many-beam diffraction conditions. The case of a systematic set of diffracting vectors is parallel to the two-beam case with a unique reversible connection between one component of the displacement field and one micrograph. In the general many-beam case there is a unique reversible connection between the vector displacement field and three micrographs. 
