
TY  - JOUR
A1  - Rossouw, CJ 
A1  - Maher, FJ 
A1  - Panjkov, AA 
T1  - A Fast-response EBIC System
JF  - Australian Journal of Physics
JO  - Aust. J.  Phys.
Y1  - 1983
VL  - 36
IS  - 4
SP  - 565
EP  - 572
KW  - 
UR  - https://doi.org/10.1071/PH830565 
N2  - The application of the EBIC technique in the study of electrical activity of defects in semiconductors is discussed, with particular reference to instrumentation. A fast-response current amplifier, built in our Division, is shown to be more than adequate for most EBIC applications. Some examples of EBIC analysis are presented. 
ER  -

