
%0 Journal Article
%A Robinson, LK 
%T Structure Factor Determination in Surface X-ray Diffraction
%J Australian Journal of Physics
%D 1988/06/01
%V 41
%N 3
%P 359-368
%K 
%R https://doi.org/10.1071/PH880359
%U https://www.publish.csiro.au/paper/PH880359 
%X A set of formulae is derived for correcting integrated diffraction intensities for surface structure analysis. These differ significantly from their bulk counterparts because of the diffuse nature of the peaks. In-plane and out-of-p1ane data collection are treated separately. Measurements of W(OOl) surface diffraction are used as a case study. 
