
%0 Journal Article
%A Olekhnovich, NM 
%T Determination of Structure Factors by the Pendellosung Effect for Imperfect Crystals
%J Australian Journal of Physics
%D 1988/06/01
%V 41
%N 3
%P 519-524
%K 
%R https://doi.org/10.1071/PH880519
%U https://www.publish.csiro.au/paper/PH880519 
%X An investigation of thickness dependence of the X-ray integrated intensity of monochromatic linearly polarised X-ray radiation in a symmetrical Laue-case diffraction reveals that the method of determination of structure factors f from thickness oscillations can be extended to real crystals with a static distribution of Coulomb-type defects or dislocations. The f E value (where E is the static Debye-Waller factor) is determined from the oscillation period, while E is determined from the tilt-angle tangent of the oscillation axis of the reduced integrated intensity. 
