Neutron and X-ray Reflectometry: Solid Multilayers and Crumpling Films
John W. White, Anthony S. Brown, Stephen A. Holt and Paul M. Saville
Australian Journal of Physics
50(2) 391 - 405
Published: 1997
Abstract
The structures of films and interfaces at the molecular level can be determined from specular reflectivity measurements using neutrons and X-rays. A general introduction to the principles of neutron and X-ray reflectometry is given. Illustrative examples of the application of neutron and X-ray reflectometry to problems of chemical and physical interest are presented.https://doi.org/10.1071/P96021
© CSIRO 1997
