X-ray Diffraction Investigation of Epitaxial Layers of CdTe on Sapphire

Abstract

The anomalous scattering of X-rays has been used to determine the polarity of CdTe epitaxial layers on sapphire. The results for two samples are presented, one of (111) orientation ('A face'), the other of (III) orientation (,B face'). The (III) layer is twinned, the two twin species being related by a 180· rotation about the [1111 axis. The twin fraction shows considerable variation for different positions on this sample, and must be taken into account when analysing the integrated X-ray intensities, in order to get meaningful Bijvoet ratios. The polarities of the two twin species are found to be the same.